AOI - SMT Inspection

AOI (Automated Optical Inspection) is used to detect defects in the SMT process from screen printing, placement, and reflow processes. AOI can specialize in certain areas (post-print, post-placement, or post-reflow), but often an AOI is capable of any type of defect detection.

With the constant variations in an SMT manufacturing process, the challenge in AOI is often to select a compromise between too much inspection, which will cripple throughput with exception warnings, and too little inspection which will pass exceptions that cause defects. AOI's are available in both In-Line and Off-Line solutions. While In-Line is ideally suited for 100% inspection, it can be resource intensive. Off-Line AOI is better suited for verifying new set-ups after a change over.

There are many players in the AOI industry. Variations in brand are significant and include support, easy of use, capability, and speed. Often buyers are forced into AOI for specific problematic components or applications. Be sure to test your requirements on any AOI before making a purchase.

Some common brands for AOI include:

Nordson YESTECH, Omron, MVP, ViTechnology, Koh Young, Mirtec, Marantz, and Viscom

All brands have their strengths and limitations in technology.  Be sure to consult with a highly experienced Capital Equipment Exchange Sales Consultant to convey your needs.  We can guide you to your best solution.

If you don't find the machine you require, please contact sales. Machines that are coming soon are not listed on our website.



Vendor: Type: Sort By:

MVP Ultra 1820 AOI

MVP Ultra 1820 AOI
Upgraded in 2013!

CEE ID: 6071
Status: Sold

MVP AutoInspector Ultra II AOI

MVP AutoInspector Ultra II AOI
Includes repair station

CEE ID: 6078
Status: Sold

CyberOptics Flex 18 AOI

CyberOptics Flex 18 AOI
Large board AOI for any inspection (solder paste, post placement, post reflow)

CEE ID: 6070
Status: Available

Agilent 5DX Series 3 X-Ray Inspection

Agilent 5DX Series 3 X-Ray Inspection
Industry-Leading Technology for Catching Defects and Improving Processes

CEE ID: 6158
Status: Available

Koh Young KY-3030 VAL AOI (SPI)

Koh Young KY-3030 VAL AOI (SPI)
Paste defects detection including insufficient / excessive / missing paste, shape deformity, bridging and paste displacement.

CEE ID: 6209
Status: Available

Koh Young KY-3030 VAL AOI (SPI)

Koh Young KY-3030 VAL AOI (SPI)
Paste defects detection including insufficient / excessive / missing paste, shape deformity, bridging and paste displacement.

CEE ID: 6210
Status: Available